Product Overview

Data Analysis Solutions

• Real-time Data Dashboard
• Adaptive Test Analysis
• Device Characterization
• Redundancy Analysis

Real Time Adaptive
Test Solutions

• Real-time Monitoring
• Outlier Detection and Rejection
• Test Time Optimization
• Dynamic Test Interface
• Yield Link Data Interface

Test Operations Solutions

• Real-time OEE and LCM
• Statistical Process Control

Meeting Your Needs

• Cost of Test
• Extreme Quality & Reliability
• Yield Learning and NPI
• Test Operations
• Working with Subcons

Making Your Job Easier

• Test & Product Engineers
• Test Operations Managers
• Yield Engineers
• Quality Engineers
• Product Line Managers
• Software Developers

Company Information

Database Solutions for Test Management
Pintail's database solutions provide a comprehensive web-based view of semiconductor test floor activity. With test data gathered in real-time from online ATEs through the SwifTest monitoring system, both Operations Managers and Test/Product Engineers gain critical technical insight into test issues, sampling efficiency, part average testing (PAT) results and test operations.

TestScape is an easy-to-use, real-time dashboard and data management system. TestScape is available in three user configurations:

• TestScape-Aware is a powerful tool for identifying test process improvement needs, reacting quickly to maverick lots, and drilling down to discover the root causes of throughput and quality issues in near-real-time. Aware gives product and test engineers a common, on-line view of test results regardless of what brand of testers is monitored or where the test floor is located.
• TestScape-SPC provides on-line, statistical process control. The user may describe a variety of control chart techniques to be used on a device by device basis. This module includes a comprehensive event management and disposition subsystem. TestScape-SPC provides an early warning system to detect process excursions and insure consistent quality of shipped devices.
• TestScape-Ops is an add-on module used to monitor test floor operations and track OEE, UPH, tester and equipment status.
• TestScape-Charzilla enables test and product engineers to perform full device characterizations on very complex devices with speed and ease. Charzilla can automatically cull the key variances and results from dozens of files and thousand of potential data points in minutes.

Client Resources
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