If achieving the highest levels of quality output is your top priority, Pintail offers a number of solutions that can help you achieve your goals.
Dynamic Outlier Detection and Rejection
While test costs are increasing, the requirements for higher levels of quality continue to squeeze semiconductor suppliers. This is especially true in the automotive electronics segment where the increased concentration of electronics remains a critical challenge. Using real-time statistical software techniques to dynamically detect and reject outliers, Pintail’s SwifTest-FOX enables chip vendors to meet these new requirements at both probe and final test.
The chart below originally presented by Freescale’s Clare Hakeman illustrates that outlier detection methods must be judged by both their effectiveness and their efficiency. Effectiveness means the ability to find true outliers. Efficiency means the avoidance of unnecessary yield loss. Working with Avago Technologies, Pintail has developed an array of the most sophisticated outlier detection algorithms in the industry, including DPAT, regression and principal component analysis. Users may also add their own proprietary algorithms to work with SwifTest-FOX
Real-time Monitoring
Pintail’s TestScape-SPC enables product engineers and test operations managers to carefully track trends and critical metrics of a device in real-time. Sophisticated WECO trending rules can catch very subtle production issues such as a measurement or device stuck at a passing level when, in fact, failures are occurring.
On-Line QA
Pintail’s SwifTest-MAX product can be adapted to performing specialized real-time decision-making such as optimizing the calibration of tester instrumentation or mid-lot calibrations. Additional quality can be achieved with contact-resistance measuring and alerting capabilities that can detect issues before they occur on
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Find out how Qualcomm used Pintail Technologies’ SwifTest-AMX™ and SwifTest-TTO™ to significantly reduce cost of test and increase margins.
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