• SwifTest-TTO Reduces Test Time Dynamically

    Challenge - you've manually optimized your test program for weeks and you are using all the parallelism your equipment can deliver. What do you do if you need another 20% test time reduction?

    SwifTest-TTO Watch

SwifTest-TTO

SwifTest-TTO is a breakthrough adaptive test product first introduced in 2003 with the help of Texas Instruments and Qualcomm. It has proven effective over billions of units of testing to reduce test time without compromising quality. It has been used in high volume applications where extensive parametric testing is required.

 SwifTest-TTO Diagram

The system takes advantage of knowledge of recent historical production results to determine under what conditions a test is statistically unlikely to fail on the next die or packaged device based upon the real-time conditions being measured at the time of the test. If the probability of a failure is so low that the next test should be skipped, test time will be saved by small incremental amounts scattered throughout the list of tests and the devices. The algorithms used are sophisticated results of many years of experience working with leading customers.

Results can be impressive since they get better as the yield of a device improves. A simple way of understanding this is to consider that in the theoretical limit, if yield were 100% on a particular test, you would not have to ever test it. SwifTest-TTO performs this adaptation dynamically, adjusting itself to each new lot. Savings of from 15% to 45% have been realized on mature production. Below is a chart from a real customer showing what happens when SwifTest-TTO is turned on.

TTO before and after

 

The savings are additive to any prior optimizations measures you may have already taken. If you are running multi-site testing for example, you savings will be added to all sites. If you have spent months reducing the test time using traditional manual methods, statistical sampling can extract another 20% plus.

Users can use our TestVision tool or TestScape-Optimize to analysis and design the optimum test plan. This plan is deployed to production via the Device Profile that will be read by SwifTest-TTO.

The reader is encouraged to read the following articles:

Adaptive Test Introduction

Architectural Requirements for Adaptive Test Systems

Case Study from Texas Instruments: Qualification of SwifTest-TTO

 

As an extra bonus for those of you who have read this far, you can get a sense of the speed benefit delivered by SwifTest-TTO by viewing this video of the world's faster production automobile!