TestVision is a desktop analysis tool designed specifically for analyzing semiconductor test data to determine the optimum test plan for either reducing test time or eliminating outliers using Salland's SwifTest family of on-line, Adaptive Test software. It is a new product replacing the original TestVision general purpose analysis tool originally introduced in 2003. The reader is encouraged to read "Introduction to Adaptive Test" first.
The user may run the following types of analyses:
Data Browser is a powerful utility for quickly viewing data one lot at a time. This tool is valuable when making final judgments about test time optimization or outlier extraction planning. It may be opened during any of the following analyses. The data browser can import STDF and TEDS formats and can be extended to handle any data format. Contact Salland for information on other data formats you might use.
Test Time Optimization enables to the user to rapidly analyze a large set of test data and determine the recommended test plan for statistical sampling using SwifTest-TTO. The user has final control over what test groups will be sampled and under what conditions. Simulation using the same sampling engine in SwifTest-TTO may be performed. A comprehensive report is produced for management and engineering review.
Outlier Analysis assists the user in determining how to best configure outlier detection and extraction. The user has complete control over what tests are going to be screen for outliers. The tool helps the user make these decisions as well as determining the best settings and outlier algorithms to use. The user can simulate what will happen in production using SwifTest-FOX (Fast Outlier eXtraction) in terms of the trade-offs between minimizing potential field defects and avoiding unnecessary yield losses.
The diagram below illustrates that the inputs to TestVision are multiple data logs and the output is the Device Profile that will be used to direct the on-line activities of SwifTest during production.
